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    THz ra­dia­ti­on and diode laser dy­na­mics

    The basic com­po­n­ents for the ge­ne­ra­ti­on of THz ra­dia­ti­on are non­line­ar ele­ments. These are re­s­pon­si­ble for the mi­xing pro­ces­ses to ge­ne­ra­te fre­quen­cies in the THz range out of vi­si­ble and near in­fra­red ra­dia­ti­on. Howe­ver, when using se­mi­con­duc­tor diode la­sers as such as our sour­ces it is pos­si­ble to uti­li­ze non­line­ar ef­fects di­rect­ly in the elec­tron plas­ma of the di­odes. With this con­cept the de­tec­tion as well as the ge­ne­ra­ti­on of THz fre­quen­cies has been shown.

    The main pre­re­qui­si­te for these ap­proa­ches is very fast time con­stants of the car­riers in the diode la­sers. This de­ter­mi­nes the abi­li­ty of the elec­trons to fol­low a mo­du­la­ti­on in the THz range. To ve­ri­fy these short time con­stants so cal­led four-wa­ve-mi­xing (FWM) ex­pe­ri­ments can be used. By ope­ra­ting a laser on two fre­quen­cies si­mul­ta­neous­ly the dif­fe­rence fre­quen­cy is ge­ne­ra­ted due to non­line­ar ef­fects. This dif­fe­rence fre­quen­cy mixes then back again with the two ori­gi­nal co­lors lea­ding to si­de-modes in the op­ti­cal spec­trum (see fig. 1) pro­ving the abi­li­ty of the elec­tron gas to fol­low the mo­du­la­ti­on.

    © RUB/ETIT/PTT

    Fi­gu­re 1: FWM ex­pe­ri­ments. The si­de­modes are ge­ne­ra­te due to mi­xing pro­ces­ses in­si­de of the diode laser. A dif­fe­rence of 1nm cor­re­sponds ap­pro­xi­mate­ly to 400G­Hz.

    Using com­mer­ci­al­ly avail­able diode la­sers we were able to de­tect the emis­si­on of the dif­fe­rence fre­quen­cy di­rect­ly out of the de­vice. Un­for­t­u­n­a­te­ly only a tiny amount of the power is emit­ted as most of the THz ra­dia­ti­on is ab­sor­bed in the high­ly doped lay­ers of the diode laser. Lots of op­ti­miza­t­i­on has to be done here to com­bi­ne low in­ter­nal ab­sorp­ti­on to­ge­ther with a wor­king wa­vegui­de for the THz fre­quen­cies.

    Be­si­de the ge­ne­ra­ti­on also the de­tec­tion of THz ra­dia­ti­on can be rea­li­zed with diode la­sers. When ex­po­sed to suf­fi­ci­ent THz power a part of the ra­dia­ti­on is ab­sor­bed in the elec­tron plas­ma lea­ding to a hea­ting of the plas­ma tem­pe­ra­tu­re. This hea­ting can be me­a­su­red ra­ther ea­si­ly as the vol­ta­ge drop over the pn-junc­tion of the diode laser is slight­ly in­crea­sed.

    © RUB/ETIT/PTT

    Ex­pe­ri­men­tal setup for the de­tec­tion of THz ra­dia­ti­on with diode la­sers.

    Howe­ver there are two main chal­len­ges to im­pro­ve the ef­fi­ci­en­cy of the diode la­sers con­cerning the in­ter­ac­tion with THz ra­dia­ti­on:

    • Stan­dard com­mer­ci­al diode la­sers which where used up to now are not op­ti­mi­zed for THz ra­dia­ti­on. This re­sults in tre­men­dous los­ses due to free car­ri­er ab­sorp­ti­on in the high­ly doped lay­ers of the di­odes. The­re­fo­re most of the THz power does not cont­ri­bu­te to the de­tec­tion pro­cess or is di­rect­ly ab­sor­bed short­ly after being ge­ne­ra­ted.
    • The con­di­ti­ons for phase­matching bet­ween the THz and op­ti­cal com­po­n­ents have to be known. This is a cru­ci­al point to im­ple­ment op­ti­miza­t­i­on sche­mes for these de­vices. Fur­ther­mo­re this re­qui­re­ment re­stricts the pro­bable ap­p­li­ca­ti­on to de­vices wor­king in a very nar­row fre­quen­cy range.

    Re­fe­rence:

    • Se­mi­con­duc­tor laser based THz ge­ne­ra­ti­on and de­tec­tion, Cars­ten Bren­ner, Ste­fan Hoff­mann, Claus-Ste­fan Fried­rich, To­bi­as Schlauch, A. Klehr, G. Er­bert, G. Tränk­le, C. Jör­dens, M. Salhi, M. Koch, Mar­tin R. Hof­mann - phys. stat. sol. C6, 564
    • In­ter­ac­tion of Se­mi­con­duc­tor Laser Dy­na­mics with THz Ra­dia­ti­on, Cars­ten Bren­ner, Ste­fan Hoff­mann, Mar­tin R. Hof­mann - Adv. in Solid State Phys. 47, 179

    Col­le­agues:

    • Cars­ten Bren­ner
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