INVESTIGATION OF ALGORITHMS AND APPLICATIONS IN THE FIELD OF OPTICAL METROLOGY
Betreuer: Prof. Dr. Martin R. Hofmann, Prof. Dr. Georg Schmitz
Author: M. Eng. Benedikt Pongs

TERAHERTZ TOMOGRAPHY
Examiner: Prof. Dr. Martin R. Hofmann, Prof. Dr. Georg Schmitz
Author: M. Sc. Hakan Aydin

MATERIAL ANALYSIS USING TERAHERTZ TECHNOLOGY
Examiner: Prof. Dr. Martin R. Hofmann, Prof. Dr. Serim Ilday
Author: M. Sc. Joshua Nyairo Onkangi

HOLOGRAPHIC CHARACTERIZATION OF SEMICONDUNTORS
Examiner: Prof. Dr. Martin. R. Hofmann, Prof. Dr. Clara J. Sa­ra­ce­no
Author: M. Sc. Leon Zens

DIODE LASER BASED SENSOR SYSTEMS
Examiner: Prof. Dr. Martin. R. Hofmann, Prof. Dr. Thomas Musch
Author: B. Sc. Niklas Schulz

MATERIAL IDENTIFICATION BY TERAHERTZ SPECTROSCOPY
Examiner: Prof. Dr. Martin. R. Hofmann, Prof. Dr. Aydin Sezgin
Author: M. Sc. Sebastian Gassel

MO­DER­N MICROSCOPY METHODS FOR THE ANALYSIS OF MICRO AND NANOSTRUCTURES
Examiner: Prof. Dr. Mar­tin R. Hof­mann , Prof. Dr. An­dre­as Wieck
Author: Dipl.-Ing. Mar­kus Fin­kel­dey

DI­ODE LASER SYSTEMS FOR TERAHERTZ APPLICATIONS
Examiner: Prof. Dr. Mar­tin R. Hof­mann , Prof. Dr. Tho­mas Mus­sen­brock
Author: M. Sc. Yinghui Hu

MUL­TI­MODA­L OPTOELECTRONIC THZ SPECTROSCOPY SYSTEM
Examiner: Prof. Dr. Martin R. Hofmann, Prof. Dr. Clara J. Sa­ra­ce­no
Author: M. Sc. Alex­an­dra Ger­ling

INVESTIGATIONS ON SPIN-CONTROLLED SEMI-CONDUCTIVE LASERS
Examiner: Prof. Dr. Mar­tin R. Hof­mann , Prof. Dr. An­dre­as Wieck
Author: M. Sc. Na­ta­lie Jung

DI­ODE LASER BASED THZ SYSTEMS
Examiner: Prof. Dr. Mar­tin R. Hof­mann , Prof. Dr. Ilona Rol­fes
Author: M. Sc. Lisa Kreu­zer

THZ SYS­TE­MS BASED ON MODE-COUPLED DIODE LASERS
Examiner: Prof. Dr. Mar­tin R. Hof­mann , Prof. Dr. Ilona Rol­fes
Author: M. Sc. Anja Na­vi­na Klee­mann