2011 results:
1511. Op­ti­cal Co­he­rence To­mo­gra­phy  
Op­ti­cal co­he­rence to­mo­gra­phy: Ap­p­li­ca­ti­ons ex­pand as tech­no­lo­gy ma­tu­res 21 March 2013, SPIE News­room.…  
1512. Op­ti­cal Co­he­rence To­mo­gra­phy - Op­ti­cal Co­he­rence To­mo­gra­phy  
Op­ti­cal Co­he­rence To­mo­gra­phy  
1513. Mo­dern Microsco­py  
Fi­gu­re 3: Star on a 1 € coin  
1514. Mo­dern Microsco­py  
Fi­gu­re 6: 200µm x 200µm se­mi­con­duc­tor samp­le in pho­to­lu­mi­nescence mode  
1515. Mo­dern Microsco­py  
Fi­gu­re 5: 200µm x 200µm se­mi­con­duc­tor samp­le in re­flec­tion mode  
1516. Mo­dern Microsco­py  
An im­portant sub­ject is the ana­ly­sis of se­mi­con­duc­tor ma­te­ri­als, es­pe­ci­al­ly the III/V se­mi­con­duc­tors…  
1517. Mo­dern Microsco­py  
Fi­gu­re 2: Test chart with struc­tu­res of 400nm, 350nm and 300nm size  
1518. Mo­dern Microsco­py  
 
1519. Mo­dern Microsco­py  
Re­fe­ren­ces: [1] Lena Schnitz­ler, Mar­kus Fin­kel­dey, Mar­tin R. Hof­mann, Nils C. Ger­hardt. "Con­trast en­han­ce­ment for…  
1520. Mo­dern Microsco­py  
Fur­ther­mo­re, a con­trast en­han­ce­ment me­thod was de­ve­lo­ped which enables also high qua­li­ty ima­ging of struc­tu­res with a…  
Search results 1511 until 1520 of 2011
To Top