2031 results:
1611. Mo­dern Microsco­py  
Fi­gu­re 6: 200µm x 200µm se­mi­con­duc­tor samp­le in pho­to­lu­mi­nescence mode  
1612. Mo­dern Microsco­py  
Fi­gu­re 5: 200µm x 200µm se­mi­con­duc­tor samp­le in re­flec­tion mode  
1613. Mo­dern Microsco­py  
An im­portant sub­ject is the ana­ly­sis of se­mi­con­duc­tor ma­te­ri­als, es­pe­ci­al­ly the III/V se­mi­con­duc­tors…  
1614. Mo­dern Microsco­py  
Fi­gu­re 2: Test chart with struc­tu­res of 400nm, 350nm and 300nm size  
1615. Mo­dern Microsco­py  
 
1616. Mo­dern Microsco­py  
Re­fe­ren­ces: [1] Lena Schnitz­ler, Mar­kus Fin­kel­dey, Mar­tin R. Hof­mann, Nils C. Ger­hardt. "Con­trast en­han­ce­ment for…  
1617. Mo­dern Microsco­py  
Fur­ther­mo­re, a con­trast en­han­ce­ment me­thod was de­ve­lo­ped which enables also high qua­li­ty ima­ging of struc­tu­res with a…  
1618. Mo­dern Microsco­py  
A microsco­pe is a ty­pi­cal tool to ana­ly­ze tiny struc­tu­res. Wi­de­ly used in sci­ence and in­dus­try, microsco­py is im­portant in…  
1619. Mo­dern Microsco­py - Mo­dern Microsco­py  
Mo­dern Microsco­py  
1620. Spintronik  
The in­jec­tion of the car­ri­er spin po­la­riza­t­i­on into the spin-VC­SEL was per­for­med op­ti­cal­ly in all our pre­vious…  
Search results 1611 until 1620 of 2031
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