Measurement techniques
Selection of measurement techniques available for our research:
Optical spectroscopy for material and device development
- Time-integrated, time resolved (2ps time resolution) and temperature dependent photo- and electroluminescence (4–325K)
- Microphotoluminescence (500nm spatial resolution)
- Single photon counting
- Polarization-resolved spectroscopy using Müller matrix analysis
- Magnetic field dependent spectroscopy up to 3.5T
- Raman spectroscopy
- Optical gain spectroscopy in processed and unprocessed samples (Hakki-Paoli, transmission method, variable stripe length method)
Optical imaging and novel imaging systems
- Standard spectroscopic optical coherence tomography (OCT and SOCT)
- Digital and photorefractive holography
- Digital holographic microscopy
- Single shot holography
- Photoacoustics based on high-power semiconductor laser diodes
- Laser-scanning and confocal microscopy
- Optical tomography
Dynamics of semiconductor lasers
- Ultrashort optical pulse measurements using optical autocorrelation
- Dispersion and chirp measurements using FROG (frequency resolved optical gating)
- Pulse and dispersion shaping using evolutionary algorithms and Spatial Light Modulators (SLMs)
- Four-wave mixing in semiconductor lasers
Terahertz technology
- cw-THz-spectroscopy and imaging based on two stabilized semiconductor lasers
- Timedomain THz-spectroscopy and imaging using fiber lasers
- Reflection and transmission tomography and imaging at 300GHz
