Selec­tion of the lab equip­ment avail­able in 7 air-con­di­tio­ned class 4 laser la­bo­ra­to­ries:

Laser sys­tems:

• Fem­to­se­cond high power Ti:Sa laser in com­bi­na­ti­on with an op­ti­cal pa­ra­me­tric oscil­la­tor (fs-OPO) and se­cond har­mo­nic ge­ne­ra­ti­on. The sys­tem is able to cover the full spec­tral range bet­ween 340nm and 1600nm with a ty­pi­cal pulse width of 120-200fs.
• Pi­co­se­cond Ti:Sa laser (680nm-1000nm)
• Ti:Sa laser, 830nm, 500mW, 30fs (own de­sign)
• Na­no­se­cond Nd:YAG laser in com­bi­na­ti­on with an op­ti­cal pa­ra­me­tric oscil­la­tor (ns-OPO). The laser sys­tem emits 5ns pul­ses at an re­pe­ti­ti­on rate of 10Hz und co­vers a spec­tral range of 355nm-2500nm
• Su­per­con­ti­nu­um light sour­ce (450nm-2400nm)
• Sta­bi­li­zed se­mi­con­duc­tor la­sers (850nm) for THz dif­fe­rence fre­quen­cy ge­ne­ra­ti­on using pho­to­mi­xing an­ten­nas
• 100fs fiber laser (1550nm, 100Hz rep. rate) with op­ti­cal delay line for pump-pro­be THz spec­trosco­py using op­ti­cal photo mi­xing

Spec­trosco­py/ De­tec­tors:

• Syn­chro-scan streak ca­me­ra with 2ps time re­so­lu­ti­on; slow sin­gle sweep unit with up to 20ps re­so­lu­ti­on
• Va­rious op­ti­cal spec­tro­me­ters with thermal­ly coo­led and LN2-coo­led ca­me­ras and sin­gle de­tec­tors (LN2-Si-CCD, LN2-In¬GaAs-OMA, LN2-Ge-pho­to­de­tec­tor, …)
• Op­ti­cal spec­trum ana­ly­zers (350-1750nm)
• Su­per­con­duc­ting ma­gnet sys­tem with op­ti­cal flow cryos­tat (4K-325K, 0-3.​5T)
• Raman spec­tro­me­ter (785nm pump)
• Op­ti­cal au­to­cor­re­la­tor in­clu­ding FROG (fre­quen­cy re­sol­ved op­ti­cal gating)
• Va­rious USB-spec­tro­me­ters for VIS and IR
• Golay cell/ py­ro­elec­tric de­tec­tors for FIR

Ima­ging:

• Con­fo­cal microsco­pe (own de­sign, la­te­ral re­so­lu­ti­on: 500nm; axial: 4µm)
• Com­mer­ci­al and cust­om de­sign OCT sys­tems
• Di­gi­tal ho­lo­gra­phic microsco­pe (own de­sign, la­te­ral re­so­lu­ti­on: 1µm; axial: 20nm)
• Lens­less di­gi­tal ho­lo­gra­phic microsco­pe (own de­sign)
• FMCW radar sys­tem for 300G­Hz ima­ging (re­flec­tion and trans­mis­si­on)
• Ima­ging ca­me­ras for VIS and NIR

Me­tro­lo­gy:

• Sto­kes po­lar­i­me­ter for po­la­riza­t­i­on re­sol­ved me­a­su­re­ments with 0,01% ac­cu­ra­cy
• Op­ti­cal power me­ters for high-power, low-power, pul­sed and cw me­a­su­re­ments
• Spa­ti­al-Light-Mo­du­la­tors
• Elec­tri­cal spec­trum ana­ly­zer, oscil­losco­pes and HF-tech­ni­que in the GHz re­gime
• Lock-in am­pli­fiers

Pro­ces­sing:

• Plas­ma Et­ching Sys­tem (tem­pora­ri­ly in­stal­led in cle­an­room of Uni­ver­si­ty of Du­is­burg-Es­sen - ZHO Du­is­burg)
• Bon­der (Ul­tra­schall-Ball-Wedge and Deep Ac­cess Wedge-Wedge)

Others:

• Op­ti­cal si­mu­la­ti­on soft­ware (Vir­tualLab and Op­tia­lix)